Outreach Activities

During MIT’s January Independent Activities Period, Shared Facilities staff teach popular mini-courses on the operation of SEF equipment and the application of the specific techniques to research problems. In summer months, Shared Facilities staff also instruct undergraduate interns from other universities and science teachers from local high schools.

2020 IAP Classes begin January 14! Read about MIT MRSEC Shared Facilities classes below.

X-ray Analysis of Food
Tuesday, January 14
10 AM to 12 PM
Room 13-4027
ENROLLMENT
No sign-up required
Enrollment: Unlimited
CONTACT
Dr. Charles Settens, 845.430.2584, SETTENS@MIT.EDU
DETAILS
Have you ever wondered what's in a chocolate bar? How much potassium is in a banana? What's the structure of those crunchy calcium lactate crystals in your cheese? The Materials Research Laboratory X-ray Diffraction Facility will host an IAP class to analyze foods in your refrigerators and cupboards. We will get to the bottom of this delicious mystery by measuring structure and chemistry using X-ray diffraction, scattering and fluorescence techniques.
Bring food sample.

Introduction to the Fundamental Principles of Transmission Electron Microscopy
Thursday, January 23
2PM - 3:15PM
Von Hippel Room, Room 13-2137
ENROLLMENT
No sign-up required
Enrollment: Unlimited
CONTACT
Dr. Yong Zhang, 617.253.5092, YZHANG05@MIT.EDU
DETAILS
The lecture provides an introduction to the fundamental principles of transmission electron microscopy. Topics covered include the illumination system, electron lenses and their aberrations, image formation and resolution. A variety of imaging and analysis techniques and their roles specific to inorganic materials, such as crystallography, diffraction patterns and high resolution imaging are to be present with practical demonstration.  This presentation will also introduce TEM sample preparation techniques for a wide range of materials, including metals, semiconductors, powders and thin films.
 

An Introduction of SEM/FIB Dual Beam Instrument
Thursday, January 30, 2020
3 PM - 4 PM
Von Hippel Room, 13-2137
ENROLLMENT
No sign-up required
Enrollment: Unlimited
CONTACT
Dr. Shiahn Chen: 617 253-4622, SCHEN3J@MIT.EDU
Patrick Boisvert: 617.253.3317, pboisver@mit.edu
DETAILS
This lecture will cover the basic principles of ion source, optics and ion-material interaction in a focused ion beam machine with an emphasis on the differences from, and similarities to, the electron-beam instrument. In addition, the lecture will describe the configuration of the FEI Helios 600 Nanolab Dual Beam workstation in the MIT MRSEC's Electron Microscopy Facility, and conclude with application examples of the material characterization and nanofabrication uses of the dual-beam workstation.

FT-IR Sampling Capabilities in MRL
Friday, January 31, 2020
10 AM-12 PM
Von Hippel Room, 13-2137
ENROLLMENT
Sign-up by January 24
Enrollment: Unlimited
CONTACT
Timothy McClure: 617.258.6470, MTIM@MIT.EDU
DETAILS
The Materials Research Laboratories Analysis Shared Experimental Facility has an Extended range FT-IR & Microscope with a variety of sampling accessories that are available for the use of researchers. Come find out about the many sampling options now available for FT-IR.