New Bruker Icon Atomic Force Microscope (AFM)

New Bruker Icon Atomic Force Microscope (AFM)

• Magnetic Force Microscopy
• Piezo Force Microscopy
• Conducting atomic force microscopy

PeakForce Tapping mode with ScanAsyst offers extremely low noise imaging of heterogeneous samples

Kelvin Force Probe Microscopy with amplitude or frequency feedback

Electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution

Pixel-by-pixel quantitative force curve characterization to probe material properties

Libby Shaw, Research Specialist
Room 13-4151  (AFM lab)
Email elshaw@mit.edu for training