New Bruker Icon Atomic Force Microscope (AFM)
- Magnetic Force Microscopy
- Piezo Force Microscopy
- Conducting atomic force microscopy
PeakForce Tapping mode with ScanAsyst offers extremely low noise imaging of heterogeneous samples
Kelvin Force Probe Microscopy with amplitude or frequency feedback
Electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution
Pixel-by-pixel quantitative force curve characterization to probe material properties
Libby Shaw, Research Specialist
Room 13-4151 (AFM lab)
Email email@example.com for training
***IMPORTANT COVID-19 UPDATE***
**Please note that Outside Shared Facilities User applications will temporarily not be accepted as a measure to contain the COVID 19 virus. Thank you for your understanding.**
Modern materials science and engineering requires sophisticated and modern equipment. The Shared Experimental Facilities (SEFs) are designed to address equipment needs too large to be satisfied by individual researchers. The Materials Science and Engineering Center operates four SEFs on the MIT campus for the analysis and processing of materials. These facilities include:
These facilities are available for use by members of the MIT research community and other academic institutions. Use of the facilities is also permitted, consistent with NSF policy (see NSF Important Notice 122*), to qualified research personnel from profit and nonprofit organizations, provided that comparable services are not available on a commercial basis in the private sector.
Our Center is part of the NSF Materials Research Facilities Network.