Materials Analysis
This facility is oriented toward multiple-technique characterization of a variety of solid materials with regard to atomic structure; chemical bonding; elemental and chemical composition of surfaces and interfaces; topographic, magnetic and piezoelectric characteristics of surfaces; and thickness and optical constants of thin films.
Electron Microscopy
This facility provides instrumentation and expertise to the MIT and general academic community for the performance of top-class electron microscopy and associated procedures.

X-ray Diffraction
This facility provides a broad base of analytical x-ray support for researchers needing both powder and single crystal diffractometry capabilities.