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Materials Analysis This facility is oriented toward multiple-technique characterization of a variety of solid materials with regard to atomic structure; chemical bonding; elemental and chemical composition of surfaces and interfaces; topographic, magnetic and piezoelectric characteristics of surfaces; and thickness and optical constants of thin films. |
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Electron Microscopy This facility provides instrumentation and expertise to the MIT and general academic community for the performance of top-class electron microscopy and associated procedures. |
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X-ray Diffraction |
MIT MRSEC
